/// <summary>
/// Lot_Run赋值
/// </summary>
/// <param name="dr">行数据</param>
private void SetLotRun(DataRow dr)
{
if (string.IsNullOrEmpty(lot_run.Lot))
{
lot_run.Lot = dr[0].ToString();
lot_run.Product = dr[1].ToString();
//debug:需要根据日期格式来判断
lot_run.MeasureTime = FixHlcmDate(dr[2].ToString()) + "_" + FixTime(dr[3]);
lot_run.Operation = "HLCMWAT";
lot_run.SpecfileName = FileName;
lot_run.TestProgram = lot_run.Product;
lot_run.Operator = "";
lot_run.ProbeCard = "";
lot_run.FlatOrientation = "DOWN";
lot_run.Owner = "";
}
Etest_Wafer_Run wafer_Run = GetWaferRun(dr);
Etest_Site site = new Etest_Site()
{
SiteID = dr[5].ToString(),
SiteX = wafer_Run.WaferNumber,
SiteY = dr[5].ToString(),
etest_ts = new List <Etest_T>()
};
for (int i = 0; i < ParameterList.Count; i++)
{
site.etest_ts.Add(new Etest_T()
{
TestID = GetTestIDByDescription(ParameterList[i]).ToString(), TestValue = dr[i + 7].ToString()
});
}
wafer_Run.sites.Add(site);
}
public void GetData(WATWafer wafer, WAT wat)
{
WaferNumber = wafer.WaferID;
// SiteCount = wat.TestSite;
ParameterCount = wafer.parameters.Count.ToString();
WaferPass = "";
Comments = "";
sites = new List <Etest_Site>();
for (int i = 0; i < Convert.ToInt32(wat.TestSite); i++)
{
Etest_Site site = new Etest_Site();
site.GetData(wat.site_coordinates[i], wafer, i);
sites.Add(site);
}
}