/// <summary> /// Lot_Run赋值 /// </summary> /// <param name="dr">行数据</param> private void SetLotRun(DataRow dr) { if (string.IsNullOrEmpty(lot_run.Lot)) { lot_run.Lot = dr[0].ToString(); lot_run.Product = dr[1].ToString(); //debug:需要根据日期格式来判断 lot_run.MeasureTime = FixHlcmDate(dr[2].ToString()) + "_" + FixTime(dr[3]); lot_run.Operation = "HLCMWAT"; lot_run.SpecfileName = FileName; lot_run.TestProgram = lot_run.Product; lot_run.Operator = ""; lot_run.ProbeCard = ""; lot_run.FlatOrientation = "DOWN"; lot_run.Owner = ""; } Etest_Wafer_Run wafer_Run = GetWaferRun(dr); Etest_Site site = new Etest_Site() { SiteID = dr[5].ToString(), SiteX = wafer_Run.WaferNumber, SiteY = dr[5].ToString(), etest_ts = new List <Etest_T>() }; for (int i = 0; i < ParameterList.Count; i++) { site.etest_ts.Add(new Etest_T() { TestID = GetTestIDByDescription(ParameterList[i]).ToString(), TestValue = dr[i + 7].ToString() }); } wafer_Run.sites.Add(site); }
public void GetData(WATWafer wafer, WAT wat) { WaferNumber = wafer.WaferID; // SiteCount = wat.TestSite; ParameterCount = wafer.parameters.Count.ToString(); WaferPass = ""; Comments = ""; sites = new List <Etest_Site>(); for (int i = 0; i < Convert.ToInt32(wat.TestSite); i++) { Etest_Site site = new Etest_Site(); site.GetData(wat.site_coordinates[i], wafer, i); sites.Add(site); } }