public void GetData(WAT wat, IList <WATSpecData> specDatas)
{
Lot = wat.LotID;
SourceLot = "";
Operation = "WAT";
MeasureTime = wat.DateTime;
Fab = "FAB2";
SpecfileName = wat.LimitFile;
TestProgram = wat.TestProgram;
Operator = wat.TesterID;
ProbeCard = wat.ProbeCardID;
FlatOrientation = wat.Notch;
Owner = wat.UserID;
foreach (WATSpecData spec in specDatas)
{
Etest_Limit limit = new Etest_Limit();
limit.GetData(spec);
etest_limits.Add(limit);
}
foreach (WATWafer wafer in wat.wafers)
{
Etest_Wafer_Run wafer_Run = new Etest_Wafer_Run();
wafer_Run.GetData(wafer, wat);
etest_wafers.Add(wafer_Run);
}
}
public void GetData(WATWafer wafer, WAT wat)
{
WaferNumber = wafer.WaferID;
// SiteCount = wat.TestSite;
ParameterCount = wafer.parameters.Count.ToString();
WaferPass = "";
Comments = "";
sites = new List <Etest_Site>();
for (int i = 0; i < Convert.ToInt32(wat.TestSite); i++)
{
Etest_Site site = new Etest_Site();
site.GetData(wat.site_coordinates[i], wafer, i);
sites.Add(site);
}
}
