public AbnormalityCauseDatas getAbnormalityCauseDatas(string type)
{
AbnormalityCauseDatas resp = new AbnormalityCauseDatas();
CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam aParam = new CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam()
{
IsCommon = true
};
if (!String.IsNullOrEmpty(type))
{
aParam.Category = type.Equals("fqc") ? "PCBA入库检" : "出厂检验";
}
else
{
aParam.CategoryStr = "'PCBA入库检','出厂检验'";
}
resp.abnormalityDatas = cv_abnormality_categorybo.GetEntities(aParam);
CV_QM_INFRA_CAUSE_CATEGORY_QueryParam cParam = new CV_QM_INFRA_CAUSE_CATEGORY_QueryParam()
{
Category = "生产过程与返修通用",
IsCommon = true
};
resp.causeDatas = cv_cause_categorybo.GetEntities(cParam);
return(resp);
}
public Int64 GetdataCount(CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam param)
{
IList <CV_QM_INFRA_ABNORMALITY_CATEGORY> entities = cV_QM_INFRA_ABNORMALITY_CATEGORYBO.GetAllByParam(param);
Int64 dataCount = entities.Count;
return(dataCount);
}
public IList <CV_QM_INFRA_ABNORMALITY_CATEGORY> getFirstAbnormality()
{
CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam param = new CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam()
{
Category = "首检",
IsCommon = true
};
return(cv_abnormality_categorybo.GetEntitiesLike(param));
}
public AbnormalityCauseDatas getAbnormalityCauseDatas()
{
AbnormalityCauseDatas resp = new AbnormalityCauseDatas();
CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam aParam = new CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam()
{
Category = "IQC",
IsCommon = true
};
resp.abnormalityDatas = cv_abnormality_categorybo.GetEntities(aParam);
CV_QM_INFRA_CAUSE_CATEGORY_QueryParam cParam = new CV_QM_INFRA_CAUSE_CATEGORY_QueryParam()
{
Category = "IQC",
IsCommon = true
};
resp.causeDatas = cv_cause_categorybo.GetEntities(cParam);
return(resp);
}
public IList <CV_QM_INFRA_ABNORMALITY_CATEGORY> GetDatas(CV_QM_INFRA_ABNORMALITY_CATEGORY_QueryParam param)
{
IList <CV_QM_INFRA_ABNORMALITY_CATEGORY> entities = cV_QM_INFRA_ABNORMALITY_CATEGORYBO.GetByParam(param);
return(entities);
}
