//赋值Etest_Limits
private List <Etest_Limit> GetEtestLimits(DataRow dr, List <Etest_Limit> etest_Limits)
{
if (dr[6].ToString() == "SPEC HI")
{
for (int i = 7; i < dr.Table.Columns.Count; i++)
{
Etest_Limit limit = new Etest_Limit
{
ID = GetTestIDByDescription(dr.Table.Columns[i].ColumnName).ToString(),
Desc = dr.Table.Columns[i].ColumnName,
SH = dr[i].ToString(),
Key = "N"
};
etest_Limits.Add(limit);
}
}
else if (dr[6].ToString() == "SPEC LO")
{
for (int i = 7; i < dr.Table.Columns.Count; i++)
{
etest_Limits[i - 7].SL = dr[i] is null ? "0" : dr[i].ToString();
}
}
else
{
throw new Exception(FilePath + "文件格式错误");
}
return(etest_Limits);
}
public void GetData(WAT wat, IList <WATSpecData> specDatas)
{
Lot = wat.LotID;
SourceLot = "";
Operation = "WAT";
MeasureTime = wat.DateTime;
Fab = "FAB2";
SpecfileName = wat.LimitFile;
TestProgram = wat.TestProgram;
Operator = wat.TesterID;
ProbeCard = wat.ProbeCardID;
FlatOrientation = wat.Notch;
Owner = wat.UserID;
foreach (WATSpecData spec in specDatas)
{
Etest_Limit limit = new Etest_Limit();
limit.GetData(spec);
etest_limits.Add(limit);
}
foreach (WATWafer wafer in wat.wafers)
{
Etest_Wafer_Run wafer_Run = new Etest_Wafer_Run();
wafer_Run.GetData(wafer, wat);
etest_wafers.Add(wafer_Run);
}
}
